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Industrial semiconductor and electronics manufacturing equipment

INDUSTRIES / SEMICONDUCTOR

From transistor to test floor.

Semiconductor manufacturing is not one workflow. Silicon360 models each segment on its own terms while preserving the connections between them.

01 / DESIGN INTELLIGENCE02 / PRODUCTION REALITY03 / MACHINE EXECUTION

INDUSTRY MAP

A manufacturing system with distinct technical domains.

The same product may cross design houses, foundries, packaging partners, qualification labs, board factories and EMS plants.

01 / 09

Fabless ASIC & SoC

Functional specification, RTL/IP lineage, PPA targets, signoff dependencies, tape-out readiness.

02 / 09

Silicon foundries

Process route, masks, material specs, fab equipment, metrology, excursions, capacity and yield.

03 / 09

Compound semiconductors

SiC / GaN substrate, epi, defects, process windows, power/thermal reliability and qualification.

04 / 09

Analog, RF & mixed signal

Parametric test, process variation, RF performance, calibration and silicon-to-package constraints.

05 / 09

OSAT & advanced packaging

Assembly flow, package design, wafer sort, die attach, flip-chip, burn-in and test traceability.

06 / 09

PCB fabrication

Stack-up, material availability, trace/space, drill, impedance, panelization, fab capability.

07 / 09

PCBA & EMS

AVL, SMT programs, setup constraints, reflow, AOI/SPI/X-ray and manufacturing yield.

08 / 09

Semiconductor equipment

Equipment capabilities, recipe dependencies, maintenance status and communication interfaces.

09 / 09

Automotive & industrial electronics

Traceability, functional safety context, controlled changes, reliability and long-lifecycle supply.

DOMAIN MODELS

Process-aware intelligence.

A wafer lot, a ceramic substrate and a PCB placement file are not interchangeable abstractions.

TECHNICAL SYSTEM

SEMICONDUCTOR TWIN

A typed process and configuration model extends the product graph.

Design ↔ mask_set ↔ process_route
Wafer_lot ↔ metrology ↔ yield_state
Die ↔ package ↔ assembly_process
Test_result ↔ requirement ↔ revision
Factory_capability ↔ validated_process_window